NDLI: Binocular automatic particle inspection machine for bottled medical liquid examination

Content Provider	IEEE Xplore Digital Library
Author	Jifei Fang Yaonan Wang Chengzhong Wu
Copyright Year	2013
Description	Author affiliation: Coll. of Electr. & Inf. Eng., Hunan Univ., Changsha, China (Jifei Fang; Yaonan Wang; Chengzhong Wu)
Abstract	Automatic Particle Inspection Machine (APIM) is capable of detecting visible impurities in ampoules and penicillin bottles. However, for Large Volume Parenteral (LVP), Dynamic Background Interference and Narrow Depth of Field problems mostly lead to failure using traditional monocular inter-frame difference algorithm. In this paper a binocular inspection algorithm and system based on monocular machine is proposed to overcome those disturbances. The binocular inspection system only changes the pose of cameras without increasing hardware costs and the algorithm employs an efficient sequential-image-stereo matching method to achieve real-time online inspection. Experimental results of inspection comparison between monocular and binocular for alarm rate and omission rate show detection validity even if the blurred parts due to the disturbance cannot be distinguished from its own background by monocular method.
Sponsorship	IEEE Syst., Man, Cybern. Soc.
Starting Page	397
Ending Page	402
File Size	750876
Page Count	6
File Format	PDF
e-ISBN	9781479903337
DOI	10.1109/CAC.2013.6775767
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2013-11-07
Publisher Place	China
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Geometry Inspection machine Liquids Transmission line matrix methods Binocular Foreign particle Interference Medical liquid Inspection Cameras Light sources
Content Type	Text
Resource Type	Article

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