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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Lopez Gonzalez, P. Baena Lecuyer, V. Guzman Miranda, H. Barrientos Rojas, J. Aguirre, M.A. |
| Copyright Year | 2014 |
| Description | Author affiliation: Electron. Eng. Dept., Univ. of Seville, Seville, Spain (Lopez Gonzalez, P.; Baena Lecuyer, V.; Guzman Miranda, H.; Barrientos Rojas, J.; Aguirre, M.A.) |
| Abstract | The analysis of wireless networks performance in ionizing scenarios represents a crucial step in order to deploy wireless intra-satellite networks instead of the classical wired communications. This novel concept introduces important benefits in terms of weight reduction and versatility, however electronic components are vulnerable to ionizing radiation environments. This work proposes a methodology for studying the communication system performance considering the Single Event Effects (SEE) as the source of communication errors. A mixed simulation/emulation platform has been developed which allows obtaining the bit error rate (BER) and the frame error rate (FER) as well as the inherent system robustness analysis under radiation. From the obtained results, a single event upset (SEU) noise model has been derived, making possible a more agile system study under different conditions and configurations. Results obtained by both the platform and the noise model allow to analyse the best suitable hardening techniques as well as the kind of forward error correction scheme which fits better with the error distribution. |
| Starting Page | 1 |
| Ending Page | 5 |
| File Size | 1662251 |
| Page Count | 5 |
| File Format | |
| ISBN | 9781479956531 |
| DOI | 10.1109/WiSEE.2014.6973071 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2014-10-30 |
| Publisher Place | Netherlands |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Wireless communication Noise model Analytical models ZigBee IEEE 802.15 Standards Transmitters System performance Noise Bit error rate Wireless Communications Single Event Upset |
| Content Type | Text |
| Resource Type | Article |
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