NDLI: Open-Waveguide dielectric measurements using complementary frequency selective surfaces (CFSS)

Content Provider	IEEE Xplore Digital Library
Author	Njoku, Chinwe C. Zhang, Shiyu Whittow, William G. Vardaxoglou, J. C.
Copyright Year	2015
Description	Author affiliation: School of Electronic, Electrical & Systems Engineering, Loughborough University, LE11 3TU, UK (Njoku, Chinwe C.; Zhang, Shiyu; Whittow, William G.; Vardaxoglou, J. C.)
Abstract	For the accurate characterization of the dielectric properties of substrates used in electromagnetic (EM) applications, robust techniques have been developed including plane-wave illumination, waveguides and resonators to meet this requirement. In previous work, the authors introduced a Waveguide-Resonator method; the resonator is the CFSS - complementary frequency selective surfaces, for dielectric constant measurements (C.C. Njoku et al., Proc. EuCAP, 2420–2422, 2013). Examining the resonant frequency, quality (Q) factor and insertion loss differences of the CFSS with and without the material under test (MUT), the permittivity and loss tangent of the MUT can be calculated. This method required the MUT cut to the WG aperture size and placed next to the CFSS within the WG in a closed environment. This paper examines the use of an open WG with one end covered by the CFSS and the sample placed over the WG flange to fully cover the aperture. Whilst the Q is low, this technique is versatile and low cost.
Starting Page	96
Ending Page	96
File Size	151222
Page Count	1
File Format	PDF
ISBN	9781479978175
DOI	10.1109/USNC-URSI.2015.7303380
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2015-07-19
Publisher Place	Canada
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Content Type	Text
Resource Type	Article

Sl.	Authority	Responsibilities	Communication Details
1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
5	Website/Portal (Helpdesk)	Queries regarding NDLI and its services	support@ndl.gov.in
6	Contents and Copyright Issues	Queries related to content curation and copyright issues	content@ndl.gov.in
7	National Digital Library of India Club (NDLI Club)	Queries related to NDLI Club formation, support, user awareness program, seminar/symposium, collaboration, social media, promotion, and outreach	clubsupport@ndl.gov.in
8	Digital Preservation Centre (DPC)	Assistance with digitizing and archiving copyright-free printed books	dpc@ndl.gov.in
9	IDR Setup or Support	Queries related to establishment and support of Institutional Digital Repository (IDR) and IDR workshops	idr@ndl.gov.in

Complementary frequency selective surfaces for waveguide dielectric measurements

Square loop complementary frequency selective surfaces

Dielectric permittivity measurement technique based on waveguide FSS filters

Complex Permittivity Measurement System for Solid Materials Using Complementary Frequency Selective Surfaces

MEMS enabled reconfigurable frequency selective surfaces: design, simulation, fabrication, and measurement

Prediction of FSS radome performane using simple design equation

A study on the properties of complementary frequency selective surfaces for permittivity measurements

Wide stop-band cascaded frequency selective surfaces with Koch fractal elements

Dielectric constant measurements of dielectric substrates at cryogenic temperature

Open-Waveguide dielectric measurements using complementary frequency selective surfaces (CFSS)

Similar Documents

Complementary frequency selective surfaces for waveguide dielectric measurements

Square loop complementary frequency selective surfaces

Dielectric permittivity measurement technique based on waveguide FSS filters

Complex Permittivity Measurement System for Solid Materials Using Complementary Frequency Selective Surfaces

MEMS enabled reconfigurable frequency selective surfaces: design, simulation, fabrication, and measurement

Prediction of FSS radome performane using simple design equation

A study on the properties of complementary frequency selective surfaces for permittivity measurements

Wide stop-band cascaded frequency selective surfaces with Koch fractal elements

Dielectric constant measurements of dielectric substrates at cryogenic temperature

Open-Waveguide dielectric measurements using complementary frequency selective surfaces (CFSS)