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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Younis, M.I. Zamli, K.Z. |
| Copyright Year | 2009 |
| Description | Author affiliation: School of Electrical and Electronics, Universiti Sains Malaysia, 14300 Nibong Tebal, Penang, Malaysia (Younis, M.I.; Zamli, K.Z.) |
| Abstract | Despite being an important activity in the software development cycle (i.e. to ensure quality and reliability), exhaustive testing is prohibitively impossible. Systematic minimization strategy based on coverage or t-way parameter interactions are often sought for to help minimize the test space. Unlike coverage based minimization strategy which takes a white box approach, t-way parameter interactions based strategy (i.e. termed t-way testing) takes a black box approach in the sense that no information regarding the implementation is required to perform the reduction. Instead, t-way testing strategy solely relies on parameter interactions between input variables. Building from earlier work, this paper proposes a new strategy, called ITTW, to minimize the number of test set using the intersection of t-way tuples. In doing so, this paper also demonstrates the correctness of the ITTW strategy. Additionally, this paper also compares ITTW strategy against existing strategies, namely: IPOG, IPOD, IPOF, IPOF2, ITCH, Jenny, TVGII, and TConfig. The results demonstrate that ITTW, in most cases, outperforms other existing strategies in terms of test size and execution time. |
| Starting Page | 221 |
| Ending Page | 226 |
| File Size | 621567 |
| Page Count | 6 |
| File Format | |
| ISBN | 9781424446810 |
| DOI | 10.1109/ISIEA.2009.5356469 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2009-10-04 |
| Publisher Place | Malaysia |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Software testing Performance evaluation System testing Multiway Testing Input variables Electronic equipment testing Programming Application software Test Plan Data Generation T-way Testing Industrial electronics Portable media players Pairwise Testing Automatic testing |
| Content Type | Text |
| Resource Type | Article |
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