NDLI: A generalized GCD test based affine partitioning algorithm

Content Provider	IEEE Xplore Digital Library
Author	Yuan Xinyu Li Ying Deng Shuiguang Cheng Jie
Copyright Year	2010
Description	Author affiliation: College of Information Science and Engineering, Ningbo University, China (Cheng Jie) \|\| College of Computer Science and Technology, Zhejiang University, Hangzhou, China (Yuan Xinyu; Li Ying; Deng Shuiguang)
Abstract	The Affine partitioning framework unifies many useful program transforms such as unimodular transformations, loop fusion, fission, scaling, reindexing, and statement reordering. The affine partitioning algorithm put forward by the SUIF compiler team has been proved to be successful in automatic discovery of the loop-level parallelization in programs. Generalized GCD Test is a basic dependence testing algorithm. In this paper, we proved that generalized GCD test has a strong relationship with affine partitioning algorithm. Then we presented an improved affine partitioning algorithm based on generalized GCD test. We illustrated that the compiling speed of affine partitioning algorithm can be significantly improved by our method.
Starting Page	866
Ending Page	871
File Size	212992
Page Count	6
File Format	PDF
ISBN	9781424476169
e-ISBN	9781424476183
DOI	10.1109/ICISE.2010.5690981
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2010-12-04
Publisher Place	China
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Algorithm design and analysis Parallel compiler Dependence testing SUIF Affine partitioning Partitioning algorithms Arrays Time factors Indexes Parallel algorithms Equations
Content Type	Text
Resource Type	Article

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