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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Jung Han Lee Jieun Lee Min-Chul Sun Won Hee Lee Mihee Uhm Seonwook Hwang In-Young Chung Dong Myong Kim Dae Hwan Kim Byung-Gook Park |
| Copyright Year | 2012 |
| Description | Author affiliation: School of Electrical Engineering, Kookmin University, Seongbuk-gu, Seoul, 136-702, Korea (Won Hee Lee; Mihee Uhm; Seonwook Hwang; Dong Myong Kim; Dae Hwan Kim) || Department of Electronics and Communications Engineering, Kwangwoon University, Seoul, 139-701, Korea (In-Young Chung) || Inter-university Semiconductor Research Center (ISRC) and School of Electrical Engineering and Computer Science, Seoul National University, 151-742, Korea (Jung Han Lee; Jieun Lee; Min-Chul Sun; Byung-Gook Park) |
| Abstract | A silicon nanowire field effect transistor (SiNW FET) was fabricated through the fabrication method compatible with that of MOSFET including back-end process without lift-off process. However, when it is working in an aqueous solution, the SiNW device as well as other transducer devices has various inherent instability problems such as hysteresis characteristics. We observed the hysteresis in DI water (DW) and confirmed that it is caused by mobile ion effect in DW with various experimental results. |
| Starting Page | 1 |
| Ending Page | 2 |
| File Size | 847120 |
| Page Count | 2 |
| File Format | |
| ISBN | 9781467309967 |
| ISSN | 21614644 |
| e-ISBN | 9781467309974 |
| e-ISBN | 9781467309950 |
| DOI | 10.1109/SNW.2012.6243305 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2012-06-10 |
| Publisher Place | USA |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Fabrication Current measurement MOSFET circuits Logic gates FETs Hysteresis Stress |
| Content Type | Text |
| Resource Type | Article |
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