NDLI: Modeling single event crosstalk in nanometer technologies

Content Provider	IEEE Xplore Digital Library
Author	Sayil, S. Boorla, V.K.
Copyright Year	2011
Description	Author affiliation: Drayer Dept. of Electr. Eng., Lamar Univ., Beaumont, TX, USA (Sayil, S.; Boorla, V.K.)
Abstract	With advances in CMOS technology, circuits become increasingly more sensitive to transient pulses caused by single event (SE) particles. On the other hand, coupling effects among interconnects can cause SE transients to contaminate electronically unrelated circuit paths which may increase the SE susceptibility of CMOS circuits. This work, for the first time, proposes an SE crosstalk noise estimation method for use in design automation tools. The proposed method uses an accurate 4-n model for interconnect and correctly models the effect of non-switching aggressors and tree branches noting the resistive shielding effect. The SE crosstalk noise expressions derived show good results in comparison to HSPICE results. Results show that average error for noise peak is about 5.2% while allowing for very fast analysis in comparison to HSPICE.
Sponsorship	IEEE Turkey Sect. CAS Chapter
File Size	311047
File Format	PDF
ISBN	9781467301602
ISSN	00189499 15581578
e-ISBN	9786050100907
DOI	10.1109/TNS.2011.2165295
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2011-12-01
Publisher Place	Turkey
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Chamber of Turkish Electric
Content Type	Text
Resource Type	Article
Subject	Nuclear and High Energy Physics Electrical and Electronic Engineering Nuclear Energy and Engineering

Sl.	Authority	Responsibilities	Communication Details
1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
5	Website/Portal (Helpdesk)	Queries regarding NDLI and its services	support@ndl.gov.in
6	Contents and Copyright Issues	Queries related to content curation and copyright issues	content@ndl.gov.in
7	National Digital Library of India Club (NDLI Club)	Queries related to NDLI Club formation, support, user awareness program, seminar/symposium, collaboration, social media, promotion, and outreach	clubsupport@ndl.gov.in
8	Digital Preservation Centre (DPC)	Assistance with digitizing and archiving copyright-free printed books	dpc@ndl.gov.in
9	IDR Setup or Support	Queries related to establishment and support of Institutional Digital Repository (IDR) and IDR workshops	idr@ndl.gov.in

Modeling Single Event Crosstalk in Nanometer Technologies

Accurate Analytical Model for Single Event (SE) Crosstalk

Single event crosstalk prediction in nanometer technologies

Crosstalk Effects Caused by Single Event Hits in Deep Sub-Micron CMOS Technologies

Modeling Single Event Crosstalk in Nanometer Technologies

High energy heavy-ion-induced single event transients in epitaxial structures

Single event coupling delay estimation in nanometer technologies

Measurement and Analysis of Interconnect Crosstalk Due to Single Events in a 90 nm CMOS Technology

Single Event Transients in Digital CMOS—A Review

Modeling single event crosstalk in nanometer technologies

Similar Documents

Modeling Single Event Crosstalk in Nanometer Technologies

Accurate Analytical Model for Single Event (SE) Crosstalk

Single event crosstalk prediction in nanometer technologies

Crosstalk Effects Caused by Single Event Hits in Deep Sub-Micron CMOS Technologies

Modeling Single Event Crosstalk in Nanometer Technologies

High energy heavy-ion-induced single event transients in epitaxial structures

Single event coupling delay estimation in nanometer technologies

Measurement and Analysis of Interconnect Crosstalk Due to Single Events in a 90 nm CMOS Technology

Single Event Transients in Digital CMOS—A Review

Modeling single event crosstalk in nanometer technologies