NDLI: Electric field detachment of a uniformly charged dielectric sphere on a dielectric coated electrode

Content Provider	IEEE Xplore Digital Library
Author	Feng, J.Q. Hays, D.A.
Copyright Year	1996
Description	Author affiliation: Wilson Center for Res. & Technol., Xerox Corp., Webster, NY, USA (Feng, J.Q.)
Abstract	In the electrophotographic process, charged toner particles are transferred from one surface to another with an electric field. To enable electric field transfer of toner, the externally applied field strength must be greater than a threshold value so that the coulombic force can overcome the toner adhesion force at the residing surface. In this work, the threshold field strength to detach a uniformly charged dielectric sphere and the electrostatic adhesion force are determined efficiently by using the Galerkin finite element method to simultaneously solve the Laplace equation for the field distribution and an overall constraint equation for the force balance. This computational method is applicable to various problem configurations. For illustrative purposes, however, the authors consider the axisymmetric problem of electric field detachment of a uniformly charged dielectric sphere on a dielectric coated electrode. Their analysis is particularly focused on the dependence of the threshold detachment field strength and electrostatic adhesion force on the dielectric coating thickness and gap between electrodes.
Starting Page	1883
Ending Page	1890
File Size	664836
Page Count	8
File Format	PDF
ISBN	0780335449
ISSN	01972618
DOI	10.1109/IAS.1996.563823
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1996-10-06
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Electrodes Laplace equations Adhesives Electrostatic analysis Photoreceptors Dielectrics Moment methods Finite element methods Coatings Pigmentation
Content Type	Text
Resource Type	Article
Subject	Industrial and Manufacturing Engineering Control and Systems Engineering Electrical and Electronic Engineering

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