NDLI: Noise measurements for the performance analysis of infrared photodetectors

Content Provider	IEEE Xplore Digital Library
Author	Giard, E. Nghiem, B.-L. Caes, M. Tauvy, M. Ribet-Mohamed, I. Taalat, R. Delmas, M. Rodriguez, J.B. Christol, P.
Copyright Year	2013
Description	Author affiliation: Inst. d'Electron. du Sud, Univ. Montpellier 2, Montpellier, France (Taalat, R.; Delmas, M.; Rodriguez, J.B.; Christol, P.) \|\| Chemin de la Huniere, ONERA/DOTA, Palaiseau, France (Giard, E.; Nghiem, B.-L.; Caes, M.; Tauvy, M.; Ribet-Mohamed, I.)
Abstract	Evaluating the performances of infrared photodetectors requires both electrical and optical measurements, including a detailed analysis of the noise behavior. Indeed, in such detectors, noise can arise from the absorbing layer (Schottky noise due to photonic and dark currents, thermal noise, low frequency noise due to technological imperfections) as well as from the read-out integrated circuit (ROIC) or from the analog to digital converter (ADC). Therefore, it is of great importance to carry out noise measurements on single elements (without ROIC and ADC) as well as on focal plane arrays. In this paper, we present noise measurements on single detectors and on a large format focal plane array, both suitable to address the 3-5μm spectral range. The single detectors are InAs/GaSb superlattice pin photodiodes which already proved to be a very promising emerging technology, whereas the focal plane array relies on the well established, high performance InSb technology.
Starting Page	1
Ending Page	4
File Size	240174
Page Count	4
File Format	PDF
ISBN	9781479906680
e-ISBN	9781479906710
DOI	10.1109/ICNF.2013.6578996
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2013-06-24
Publisher Place	France
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Temperature measurement Noise Superlattices InSb Detectors Infrared detector Dark current InAs/GaSb superlattice photodiode Shot noise Noise measurement Photodiodes Focal plane array
Content Type	Text
Resource Type	Article

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High performance GaSb/InAs superlattice long-wave infrared focal plane array

Fabrication and characterization of InAs/GaSb strained layer superlattice infrared focal plane array detectors

Excess noise in long-wavelength infrared InAs/GaSb type-II superlattice pin-photodiodes

Noise Characterization of Midwave Infrared InAs/GaSb Superlattice pin Photodiode

Background Limited Performance of Long Wavelength Infrared Focal Plane Arrays Fabricated From M-Structure InAs–GaSb Superlattices

Recent Advances in LWIR Type-II InAs/GaSb Superlattice Photodetectors and Focal Plane Arrays at the Center for Quantum Devices

High performance dual-band long-wave infrared focal plane array based on type-II InAs/GaSb superlattices

Spatial Noise and Correctability of Type-II InAs/GaSb Focal Plane Arrays

Long-Wave InAs/GaSb Superlattice Detectors Based on nBn and Pin Designs

Noise measurements for the performance analysis of infrared photodetectors

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