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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Wei Li Yu-Ying Liang Gang Pan Jiao Sun |
| Copyright Year | 2013 |
| Description | Author affiliation: Xi'an Army Generation Bur., Yellow River Army Generation Chamber, Xi'an, China (Jiao Sun) || Dept. of Electron. & Opt. Eng., Ordnance Eng. Coll., Shijiazhuang, China (Wei Li; Yu-Ying Liang; Gang Pan) |
| Abstract | The high reliability and long life characteristics of electronic products result in long degradation test time and low efficiency. Traditional degradation test depends on priori information and statistical analysis method is complex. In view of those problems, an evaluation method of step-down stress accelerated degradation modeling based on Gamma process is proposed. Firstly, the degradation path is portrayed by a Gamma process. Then using the Gamma process characteristics and MCMC method, the parameters are evaluated. this method greatly simplifies the procedure of statistical analysis. Finally, the simulation of metallized film capacitors is provided, the assessment of step-down stress is compared with constant stress and step-up stress, the validity and the efficiency of the proposed method is presented. |
| Starting Page | 312 |
| Ending Page | 315 |
| File Size | 384972 |
| Page Count | 4 |
| File Format | |
| e-ISBN | 9781479910168 |
| DOI | 10.1109/QR2MSE.2013.6625591 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2013-07-15 |
| Publisher Place | China |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Degradation Step-down stress Films Capacitors Accelerated degradation modeling MCMC method Life estimation Gamma process Reliability Acceleration Stress |
| Content Type | Text |
| Resource Type | Article |
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