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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Chao Shen Tien Khee Ng Ooi, B.S. Dongkyu Cha |
| Copyright Year | 2013 |
| Description | Author affiliation: Photonics Lab., King Abdullah Univ. of Sci. & Technol., Thuwal, Saudi Arabia (Chao Shen; Tien Khee Ng; Ooi, B.S.) || Adv. Nanofabrication Imaging & Characterization Lab. (ANIC), King Abdullah Univ. of Sci. & Technol., Thuwal, Saudi Arabia (Dongkyu Cha) |
| Abstract | Micro-structured group-III-nitrides are considered as promising strain relief structures for high efficiency solid state lighting. In this work, the strain field in InGaN/GaN multiquantum wells (MQWs) micro-pillars is investigated using micro-Raman spectroscopy and the design of micro-pillars were studied experimentally. We distinguished the strained and strain-relieved signatures of the GaN layer from the $E_{2}$ phonon peak split from the Raman scattering signatures at 572 $cm^{-1}$ and 568 $cm^{-1},$ respectively. The extent of strain relief is examined considering the height and size of micro-pillars fabricated using focused ion beam (FIB) micro-machining technique. A significant strain relief can be achieved when one micro-machined through the entire epi-layers, 3 μm in our study. The dependence of strain relief on micro-pillar diameter (D) suggested that micro-pillar with D <; 3 μm showed high degree of strain relief. Our results shed new insights into designing strain-relieved InGaN/GaN microstructures for high brightness light emitting diode arrays. |
| Sponsorship | IEEE Western Saudi Arabia Sect. |
| Starting Page | 1 |
| Ending Page | 3 |
| File Size | 801948 |
| Page Count | 3 |
| File Format | |
| ISBN | 9781467361965 |
| e-ISBN | 9781467361958 |
| e-ISBN | 9781467361941 |
| DOI | 10.1109/SIECPC.2013.6550773 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2013-04-27 |
| Publisher Place | Greece |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Micro-pillar Raman scattering Measurement by laser beam Strain relief Light emitting diodes Epitaxial growth InGaN/GaN quantum well Gallium nitride Quantum well devices Strain |
| Content Type | Text |
| Resource Type | Article |
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