NDLI: Laser reflectance microscopy 2-D tissue imaging system

Content Provider	IEEE Xplore Digital Library
Author	Popat, H. Poshwal, T. Singh, M. Nawraj, N. Indumathi, J.
Copyright Year	2010
Description	Author affiliation: Biomedical Engineering, VIT University, Vellore, India (Popat, H.; Poshwal, T.; Singh, M.; Nawraj, N.; Indumathi, J.)
Abstract	The interactions of laser radiation with pathological slide reveal their diverse optical characteristic depending on their compositional variation. Their point to point compositional variation is determined by reconstruction of the reflectance images which carry valuable information. However conventional microscope only deals with giving the image as an enlarged form, and is also light dependent. The system of confocal imaging is very complex and involves large number of lenses. Surface reflected laser radiations from slide are measured by a reflectance imager. Laser radiations (680 nm) are guided by an optical fiber inclined at 45 degree angle and reflected radiations are collected by photo detectors placed at an angle of 45 degree to the source which is also at 45 degree. An array of source and detectors (i.e. 12 source and 12 detectors) are placed in a probe which is stationary. The slide is placed on a platform which moves in steps of 1mm.The platform moves and data representing two-dimensional variation are collected, after amplification, these are digitized, and post processing of the images is done. An advanced algorithm of image processing is used and color coding is done. The probe design is highly refined and first of its kind. The accuracy is high since the source is stationary. The reflected image can be inferred by the processing technique which gives useful parameters. This system is capable of producing output equivalent to C.T-scan or M.R.I in one-fifth of their cost.
Starting Page	81
Ending Page	85
File Size	1104060
Page Count	5
File Format	PDF
ISBN	9781612840390
e-ISBN	9781612840383
DOI	10.1109/ICSMB.2010.5735349
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2010-12-16
Publisher Place	India
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Integrated optics Slide images Biomedical optical imaging Stimulated emission Reflected intensity Lasers Biological tissues Optical imaging Optical reflection Image reconstruction Probe reflectometer
Content Type	Text
Resource Type	Article

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4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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