NDLI: Multi-camera Very Wide Baseline Feature Matching Based on View-Adaptive Junction Detection

Content Provider	IEEE Xplore Digital Library
Author	Perez, M. Salgado, L. Arrospide, J. Marinas, J. Nieto, M.
Copyright Year	2012
Abstract	This paper presents a strategy for solving the feature matching problem in calibrated very wide-baseline camera settings. In this kind of settings, perspective distortion, depth discontinuities and occlusion represent enormous challenges. The proposed strategy addresses them by using geometrical information, specifically by exploiting epipolarconstraints. As a result it provides a sparse number of reliable feature points for which 3D position is accurately recovered. Special features known as junctions are used for robust matching. In particular, a strategy for refinement of junction end-point matching is proposed which enhances usual junction-based approaches. This allows to compute cross-correlation between perfectly aligned plane patches in both images, thus yielding better matching results. Evaluation of experimental results proves the effectiveness of the proposed algorithm in very wide-baseline environments.
Starting Page	74
Ending Page	77
File Size	322426
Page Count	4
File Format	PDF
ISBN	9781467324489
e-ISBN	9780769547916
DOI	10.1109/EST.2012.34
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2012-09-05
Publisher Place	Portugal
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Geometry Correlation Wide baseline Image edge detection Detectors Feature extraction Cameras Feature matching Junction Junctions Cross-correlation Projective geometry
Content Type	Text
Resource Type	Article

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