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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Dong Liu Weiyan Xing Zhongwen Zhao Peng Wang Honglin Zhang |
| Copyright Year | 2010 |
| Description | Author affiliation: School of Computer, National University of Defense Technology, Changsha, China (Honglin Zhang) || Department of Testing and Command, Academy of Equipment Command & Technology, Beijing, China (Weiyan Xing) || Key Lab of Defense Technology, Academy of Equipment Command & Technology, Beijing, China (Dong Liu; Zhongwen Zhao; Peng Wang) |
| Abstract | In cut sequence set (CSS) model, dynamic gates of dynamic fault trees (DFT) are transformed into sequence failure expressions (SFE) according to their dynamic meanings, in order to describe the dynamic behaviors that can induce system failure. The paper discussed how to transform dynamic gates into CSS, and researched the influences of different dynamic gates on CSS model. The paper pointed out that FDEP and SEQ gates were not applicable to CSS model, since they were the upper level expression of dynamic behavior and could not describe the direct relationships between components behaviors and system failure. The paper also put forward some rules that one should follow to construct reasonable DFT in CSS analysis. In a word, the paper is a summarization about how to utilize and deal with dynamic gates in CSS model. |
| Starting Page | 245 |
| Ending Page | 248 |
| File Size | 656048 |
| Page Count | 4 |
| File Format | |
| ISBN | 9781424481002 |
| e-ISBN | 9781424481026 |
| DOI | 10.1109/ICMET.2010.5598357 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2010-09-10 |
| Publisher Place | Singapore |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Cut sequence set Dyanmic fault tree Logic gates Dynamic gate Reliability |
| Content Type | Text |
| Resource Type | Article |
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