NDLI: A reliability indication method for constant-time admission control test

Content Provider	IEEE Xplore Digital Library
Author	Fei Teng Lei Yu Magoules, F.
Copyright Year	2011
Description	Author affiliation: Applied Mathematics and Systems Lab, Ecole Centrale Paris, Chatenay Malabry, France (Magoules, F.) \|\| Applied Mathematics and Systems Lab, Ecole Centrale Paris, Chatenay Malabry France (Fei Teng) \|\| Ecole Centrale de Pekin, Beihang University, Beijing, China (Lei Yu)
Abstract	Admission control test aims at determining whether an arriving task can be scheduled together with the tasks already running in a system, so that it can prevent system from overload and collapse. Although a number of schedulability tests have been studied, they are incomparable if the determination conditions are different. In order to keep high system utilization, the problem of choosing a reliable test attracts our attention. In this paper, we introduce a concept of test reliability to evaluate the probability that a random task set can pass a given test, and define a reliability indicator to show the test reliability. The proposed method is applied in several existing admission control tests. Results show that this method can be used as a criterion to compare the performance of different tests. The most applicable condition can be selected among several alternatives using the reliability indicator, if system parameters are determined in advance.
Starting Page	199
Ending Page	209
File Size	2105142
Page Count	11
File Format	PDF
ISBN	9781457704734
e-ISBN	9788988678473
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2011-08-16
Publisher Place	Korea (South)
Access Restriction	Subscribed
Rights Holder	AICIT
Subject Keyword	Real time systems Realtime task Admission control Clustering algorithms Reliability indication Delta modulation Scheduling Admission control test Complexity theory Reliability
Content Type	Text
Resource Type	Article

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