NDLI: Prioritizing Variable-Strength Covering Array

Content Provider	IEEE Xplore Digital Library
Author	Rubing Huang Jinfu Chen Tao Zhang Rongcun Wang Yansheng Lu
Copyright Year	2013
Description	Author affiliation: Sch. of Comput. Sci., Univ. of Seoul, Seoul, South Korea (Tao Zhang) \|\| Sch. of Comput. Sci. & Technol., Huazhong Univ. of Sci. & Technol., Wuhan, China (Rubing Huang; Rongcun Wang; Yansheng Lu) \|\| Sch. of Comput. Sci. & Telecommun. Eng., Jiangsu Univ., Zhenjiang, China (Jinfu Chen)
Abstract	Combinatorial interaction testing is a well-studied testing strategy, and has been widely applied in practice. Combinatorial interaction test suite, such as fixed-strength and variable-strength interaction test suite, is widely used for combinatorial interaction testing. Due to constrained testing resources in some applications, for example in combinatorial interaction regression testing, prioritization of combinatorial interaction test suite has been proposed to improve the efficiency of testing. However, nearly all prioritization techniques may only support fixed-strength interaction test suite rather than variable-strength interaction test suite. In this paper, we propose two heuristic methods in order to prioritize variable-strength interaction test suite by taking advantage of its special characteristics. The experimental results show that our methods are more effective for variable-strength interaction test suite by comparing with the technique of prioritizing combinatorial interaction test suites according to test case generation order, the random test prioritization technique, and the fixed-strength interaction test suite prioritization technique. Besides, our methods have additional advantages compared with the prioritization techniques for fixed-strength interaction test suite.
Starting Page	502
Ending Page	511
File Size	251403
Page Count	10
File Format	PDF
ISBN	9780769549866
ISSN	07303157
DOI	10.1109/COMPSAC.2013.84
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2013-07-22
Publisher Place	Japan
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Testing Arrays Educational institutions Fault detection Heuristic algorithms Computer science Software algorithm Software testing combinatorial interaction testing test case prioritization fixed-strength interaction test suite variable-strength interaction test suite
Content Type	Text
Resource Type	Article
Subject	Computer Science Applications Software

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1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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