NDLI: New method for evaluation of water treeing properties of semiconductive materials

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New method for evaluation of water treeing properties of semiconductive materials

Content Provider	IEEE Xplore Digital Library
Author	Nilsson, U.H.
Copyright Year	1989
Description	Author affiliation: Neste Polyeten AB, Stenungsund, Sweden (Nilsson, U.H.)
Abstract	An effort was made to develop a simple test method for evaluation of water treeing properties of semiconducting materials. The necessity of an interface between the semiconducting and the insulating parts of the test object, which well reproduce the interfaces in a triple extruded power cable, motivated the use of an object made partly from a coextruded tape. It is shown that the treeing performance of semiconducting materials can be evaluated using such modified Rogowski objects. With the aging parameters adopted in this investigation, an aging time of approximately 10 weeks was necessary. No unambiguous relation between the number of vented trees and the degree of contamination could be found. Nevertheless, the cleanest semiconductor initiated the lowest amount of vented trees, whereas the semiconductor with the most vented trees also contained the highest amount of ionic contamination. The same correlation was found for the length of the vented trees.<>
Starting Page	264
Ending Page	266
File Size	157307
Page Count	3
File Format	PDF
DOI	10.1109/ICSD.1989.69201
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1989-07-03
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Water Trees - insulation Semiconductivity Semiconductor device testing Semiconductor materials Aging Contamination Materials testing Cable insulation Power cables
Content Type	Text
Resource Type	Article

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