NDLI: Automated parameter extraction software for advanced IGBT modeling

Content Provider	IEEE Xplore Digital Library
Author	Hefner Jr., A. Bouche, S.
Copyright Year	2000
Description	Author affiliation: Div. of Semicond. Electron., Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA (Hefner, A., Jr.)
Abstract	A software package for extracting parameters to be used in advanced IGBT models is presented. In addition, new model equations and extraction procedures are introduced that more accurately describe a wide range of IGBT types including the Warp-Speed IGBTs. The parameter extraction software package consists of five programs that extract the 20 physical and structural parameters needed in the most recent version of the Hefner IGBT model. Each program has a graphical user interface and uses the IEEE 488 bus to control the measurement instruments. Various algorithms are employed for fitting the IGBT model equations to measured data. The new software package enables users of the simulation software products to extract model parameters themselves and thus permits the simulation of new IGBT part numbers as soon as they are introduced.
Starting Page	10
Ending Page	18
File Size	1599008
Page Count	9
File Format	PDF
ISBN	0780365615
DOI	10.1109/CIPE.2000.904684
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2000-07-16
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Parameter extraction Insulated gate bipolar transistors Software packages Equations NIST Data mining Circuit simulation Electric variables measurement Structural engineering Graphical user interfaces
Content Type	Text
Resource Type	Article

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4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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