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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Jing Zhou Schalkoff, R.J. Dean, B.C. Halford, J.J. |
| Copyright Year | 2012 |
| Description | Author affiliation: Dept. of Neurosciences, Med. Univ. of South Carolina, Charleston, SC, USA (Halford, J.J.) || Dept. of Electr. & Comput. Eng., Clemson Univ., Clemson, SC, USA (Jing Zhou; Schalkoff, R.J.) || Dept. of Comput. Sci., Clemson Univ., Clemson, SC, USA (Dean, B.C.) |
| Abstract | New wavelet-derived features and strategies that can improve autonomous EEG classifier performance are presented. Various feature sets based on the morphological structure of wavelet subband coefficients are derived and evaluated. The performance of these new feature sets is superior to Guler's classic features in both sensitivity and specificity. In addition, the use of (scalp electrode) spatial information is also shown to improve EEG classification. Finally, a new strategy based upon concurrent use of several mother wavelets is shown to result in increased sensitivity and specificity. Various attempts at reducing feature vector dimension are shown. A non-parametric method, k-NNR, is implemented for classification and 10-fold cross-validation is used for assessment. |
| Sponsorship | IEEE Eng. Medicine Biol. Soc. |
| Starting Page | 3959 |
| Ending Page | 3962 |
| File Size | 293988 |
| Page Count | 4 |
| File Format | |
| ISBN | 9781424441198 |
| ISSN | 1557170X |
| e-ISBN | 9781457717871 |
| DOI | 10.1109/EMBC.2012.6346833 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2012-08-28 |
| Publisher Place | USA |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Sensitivity Vectors Feature extraction Electroencephalography Scalp Wavelet transforms Electrodes |
| Content Type | Text |
| Resource Type | Article |
| Subject | Signal Processing Biomedical Engineering Health Informatics Computer Vision and Pattern Recognition |
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