NDLI: An efficient algorithm for the extraction of compressed diagnostic information from embedded memory cores

Content Provider	IEEE Xplore Digital Library
Author	Bernardi, P. Rebaudengo, M. Reorda, M.S.
Copyright Year	2003
Description	Author affiliation: Dipt. di Autom. e Inf., Politecnico di Torino, Italy (Bernardi, P.; Rebaudengo, M.; Reorda, M.S.)
Abstract	This paper addresses the issue of diagnosing a memory core embedded in a complex SOC. The proposed solution is based on a P1500-compliant wrapper. The proposed solution exploits a hardware-implemented compression method that minimizes the amount of data to be transferred from the core to the ATE. The proposed solution takes into account several constraints existing in an industrial environment, such as reducing the time and area overheads required for diagnosis, and minimizing the cost of the external ATE. Experimental results are provided allowing evaluating the benefits and limitations of the adopted solution.
Sponsorship	IEEE Ind. Electron. Soc. UNINOVA & Univ. Nova de Lisboa-FCT- DEE
Starting Page	417
Ending Page	421
File Size	329471
Page Count	5
File Format	PDF
ISBN	0780379373
DOI	10.1109/ETFA.2003.1247736
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2003-09-16
Publisher Place	Portugal
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Data mining System-on-a-chip System testing Logic testing Fault diagnosis Costs Read-write memory Built-in self-test Lakes Semiconductor memory
Content Type	Text
Resource Type	Article

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An efficient algorithm for the extraction of compressed diagnostic information from embedded memory cores