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Content Provider | IEEE Xplore Digital Library |
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Author | Shimada, O. Ito, K. Miyagi, T. Kimijima, S. Sudo, T. |
Copyright Year | 1989 |
Description | Author affiliation: Toshiba Corp., Kanagawa, Japan (Shimada, O.; Ito, K.; Miyagi, T.; Kimijima, S.; Sudo, T.) |
Abstract | The authors report the electrical properties of multilayer thin-film interconnects examined under circumstances in which the signal lines were sandwiched between mesh-pattern metal layers (called meshed stripline). Multilayer thin-film substrates with various transmission line structures were manufactured with several mesh patterns (power/ground planes) and signal lines, and the characteristic impedance and crosstalk for these lines were measured. The relations between the electrical properties and the meshed-stripline structures were obtained from the measurements for use in designing multilayer thin-film interconnects. It is shown that, in meshed-stripline structures, the characteristic impedance can be controlled by changing the aperture ratio or the mesh pitch. The fluctuation in the characteristic impedance along the signal-propagation direction was insignificant. It was also found that the crosstalk noise in meshed-stripline structures can be made as low as those in ordinary stripline structures.< |
Starting Page | 121 |
Ending Page | 127 |
File Size | 483462 |
Page Count | 7 |
File Format | |
DOI | 10.1109/IEMTS.1989.76121 |
Language | English |
Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Publisher Date | 1989-04-26 |
Access Restriction | Subscribed |
Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Subject Keyword | Nonhomogeneous media Transistors Substrates Stripline Crosstalk Transmission line measurements Power transmission lines Manufacturing Impedance measurement Power measurement |
Content Type | Text |
Resource Type | Article |
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