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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Berdinsky, A.S. Shevtsov, Y.V. Saranchin, Y.A. Rubin, S.V. Shubin, Y.V. Ayupov, B.M. Fink, D. Chadderton, L.T. Lee, J.H. |
| Copyright Year | 2000 |
| Description | Author affiliation: Dept. of Semicond. Devices & Microelectron., Novosibirsk State Tech. Univ., Russia (Berdinsky, A.S.) |
| Abstract | We report the technology of sandwich structure based on fullerene films and experimental results in research of optical and conductivity properties of sandwich samples. The single-crystal of sapphire [100] or silicon was used as a substrate. The sandwich specimens were based on structure M/C/sub 60/ fullerene film/M (M=Cr,Pd,Ag,Al,Cu). The thickness of fullerene films /spl sim/0.2-1.0 /spl mu/m. The area of C/sub 60/ film under the top contact /spl sim/1 cm/sup 2/. The specimens have been investigated in IR-spectroscopy, spectra-photometry, ellipsometry and XRD. The measurements of I-V characteristics and research in temperature dependence of conductivity were made as well. It was shown that metals as Cr, Pd, Ag, Al, Cu penetrates easy in fullerene film. It appears that specimens show the large value of conductivity. Silver/C/sub 60/ structure and other sandwich structures show semiconductor behaviour of conductivity. |
| Starting Page | 151 |
| Ending Page | 156 |
| File Size | 575746 |
| Page Count | 6 |
| File Format | |
| ISBN | 0780359038 |
| DOI | 10.1109/APEIE.2000.913109 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2000-09-29 |
| Publisher Place | Russia |
| Access Restriction | Subscribed |
| Rights Holder | Novosibirsk State Technical University |
| Subject Keyword | Sandwich structures Optical films Conductive films Silicon Substrates Ellipsometry X-ray scattering Conductivity measurement Temperature dependence Chromium |
| Content Type | Text |
| Resource Type | Article |
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