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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Deshpande, V. Djara, V. O'Connor, E. Hashemi, P. Balakrishnan, K. Sousa, M. Caimi, D. Olziersky, A. Czornomaz, L. Fompeyrine, J. |
| Copyright Year | 2015 |
| Description | Author affiliation: IBM Research GmbH Zurich Laboratory, Saumerstrasse 4, CH-8803 Ruschlikon, Switzerland (Deshpande, V.; Djara, V.; O'Connor, E.; Sousa, M.; Caimi, D.; Olziersky, A.; Czornomaz, L.; Fompeyrine, J.) || IBM T.J. Watson Research Center, 1101 Kitchawan Rd., Route 134 Yorktown Heights, NY 10598 USA (Hashemi, P.; Balakrishnan, K.) |
| Abstract | We demonstrate, for the first time, scaled hybrid inverters built in a 3D Monolithic (3DM) CMOS process featuring short-channel replacement metal gate (RMG) InGaAs-OI wide-fin/planar nFET top layer and SiGe-OI fin pFET bottom layer. We achieve state-of-the-art device integration, using raised source drain (RSD) on both levels and silicide on bottom pFETs. Bottom SiGe-OI pFETs are scaled down to sub-20 nm gate length (Lg) using a gate first (GF) flow, and top InGaAs nFETs scaled down to sub-50 nm Lg are fabricated using a RMG process. With an optimized thermal budget for the top InGaAs nFETs, we show that the 3D integration scheme does not degrade the performance of the bottom SiGe-OI pFETs. Finally, we demonstrate well-behaved integrated inverters with sub-50 nm Lg down to VDD = 0.25 V. |
| File Size | 1772758 |
| File Format | |
| ISSN | 2156017X |
| e-ISBN | 9781467398947 |
| DOI | 10.1109/IEDM.2015.7409658 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2015-12-07 |
| Publisher Place | USA |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Indium gallium arsenide Fabrication Logic gates CMOS integrated circuits Inverters Annealing Three-dimensional displays |
| Content Type | Text |
| Resource Type | Article |
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