NDLI: Study of conducted emission measurement for equipment with multiple supply ports

Content Provider	IEEE Xplore Digital Library
Author	Santhosh Kumar, P. Salil, P. Subbarao, B.
Copyright Year	2008
Description	Author affiliation: EMC Div., Centre for Electromagn., Chennai, India (Santhosh Kumar, P.; Salil, P.; Subbarao, B.)
Abstract	It is common for the equipment under test (EUT) to have multiple input power ports. The International Commercial Standards on conducted emission (CE) specifies only about the measurement of the noise at individual power supply ports using line impedance stabilization network (LISN). The effect of the power supply ports other than the one which is tested, such as the noise getting on to the system via the other power supply ports or the low impedance path for the noise through the other ports bypassing the LISN, is often ignored. It is observed that the impedance at other power supply ports has a major influence on the noise measurement at the test port. In this paper effort is made to demonstrate the effect of other power supply ports on the test measurement. The measurement results with different configurations are presented here. The observations may be referred to the standard setting committee and considered for possible amendment in the standard during the revision.
Starting Page	287
Ending Page	289
File Size	4481188
Page Count	3
File Format	PDF
ISBN	9788190357517
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2008-11-26
Publisher Place	India
Access Restriction	Subscribed
Rights Holder	Society of EMC Engineers
Subject Keyword	Power measurement Impedance measurement Noise measurement Power supplies Electromagnetic measurements Measurement standards Circuit testing Radio frequency Electromagnetic compatibility Electromagnetic interference Multiple power ports Conducted Emission LISN
Content Type	Text
Resource Type	Article

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