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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Daher, J.K. Goodroe, J.M. |
| Copyright Year | 1990 |
| Description | Author affiliation: Georgia Inst. of Technol., Atlanta, GA, USA (Daher, J.K.; Goodroe, J.M.) |
| Abstract | The authors describe a test technique and procedure for performing radiated susceptibility testing of printed circuit (PC) boards which implement built-in-test (BIT) or boundary scan designs. The measurement technique involves illumination of the circuit-under-test (CUT) with an electromagnetic plane wave generated in a TEM (transverse-electromagnetic) cell using a fiber-optic input/output (I/O) interface to the external test equipment. By isolating the CUT from the rest of the test environment, flaws in the EMI (electromagnetic interference) design/layout of PC boards can readily be identified and quickly retested using the recommended technique. Only a limited number of I/O pins must be interfaced to the digital test equipment when testing in BIT mode. A specific example of the use of these techniques and procedures as applied to a self-testing Am29034-bit microprocessor slice test circuit is also given.< |
| Starting Page | 109 |
| Ending Page | 112 |
| File Size | 245667 |
| Page Count | 4 |
| File Format | |
| ISBN | 0780372646 |
| DOI | 10.1109/ISEMC.1990.252741 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 1990-08-21 |
| Publisher Place | USA |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Circuit testing Test equipment Electromagnetic interference Performance evaluation Printed circuits Measurement techniques Lighting Electromagnetic scattering Electromagnetic radiation Optical fiber devices |
| Content Type | Text |
| Resource Type | Article |
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