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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Hayashi, Y.-i. Songping Wu Jun Fan Mizuki, T. Sone, H. |
| Copyright Year | 2010 |
| Description | Author affiliation: Department of Electrical and Communication Engineering, Graduate School of Engineering, Tohoku University, Aramaki Aza 6-6-05, Sendai 980-8579, Japan (Hayashi, Y.-i.) || Cyberscience Center, Tohoku University, Aramaki Aza 6-3, Sendai 980-8579, Japan (Mizuki, T.; Sone, H.) || Missouri S&T EMC Laboratory, Missouri University of Science and Technology, Rolla, 65409, USA (Songping Wu; Jun Fan) |
| Abstract | It is found from previous studies on the immunity issues of CATV coaxial cables due to contact failure that, when contact resistance is small, the contact distribution and the number of contact points become factors that affect the degradation in immunity of the cables. However, when contact resistance is relatively large, the effects of the contact distribution and the number of contact points are negligible. In this paper, the physics of this phenomenon is further studied. Simulation results, validated by measurement, reveal that the contact distribution and the number of contact points contribute to parasitic inductances that could change the current distribution among the contact points, and further affect the immunity performance of the cables. Using a contact failure model proposed in this paper, cable contact scenarios at the connectors with different contact distributions and numbers of contact points can be simply simulated by changing the inductance term in the model. |
| Starting Page | 743 |
| Ending Page | 747 |
| File Size | 530235 |
| Page Count | 5 |
| File Format | |
| ISBN | 9781424463053 |
| ISSN | 21581118 |
| e-ISBN | 9781424463084 |
| DOI | 10.1109/ISEMC.2010.5711371 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2010-07-25 |
| Publisher Place | USA |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Inductance Contact resistance Connectors Coaxial cables Current distribution Capacitance |
| Content Type | Text |
| Resource Type | Article |
| Subject | Condensed Matter Physics Electrical and Electronic Engineering |
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