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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Xian Jinlong Shen Xiannian |
| Copyright Year | 2007 |
| Description | Author affiliation: Henan Univ. of Technol., Zhengzhou (Xian Jinlong; Shen Xiannian) |
| Abstract | ATEM cell is widely used in electromagnetic compatibility (EMC) test. When loaded with equipment under test (EUT), the electric field in ATEM cell will be distorted , and the characteristic impedance changed. In this paper, the field distribution and characteristic impedance in ATEM cell loaded with rectangular metallic EUT is analyzed by a simple method---point matching method. The section of an asymmetric TEM was divided into five regions and potential function is expressed as a Fourier series in each region. The point-matching was used on the interface of these regions to determine coefficients of series. Thus, the characteristic impedance can be calculated and electric field obtained in terms of a potential function. |
| Starting Page | 445 |
| Ending Page | 447 |
| File Size | 111849 |
| Page Count | 3 |
| File Format | |
| ISBN | 9781424413713 |
| DOI | 10.1109/ELMAGC.2007.4413527 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2007-10-23 |
| Publisher Place | China |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Impedance Conductors Testing Equations Transmission lines Electromagnetic compatibility Voltage Capacitance Electrons Roads EUT TEM cell electric field distribution Characteristic impedance |
| Content Type | Text |
| Resource Type | Article |
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