NDLI: Return loss characterization and analysis of high-speed serial interface

Content Provider	IEEE Xplore Digital Library
Author	Beyene, W.T. Madden, C. Vaidya, N. Hai Lan
Copyright Year	2015
Description	Author affiliation: Rambus Inc., Sunnyvale, CA, USA (Beyene, W.T.; Madden, C.; Vaidya, N.; Hai Lan)
Abstract	This paper describes the return loss characterization and analysis of a high-speed serial interface with T-coils at the transmitter and receiver. Today's high-speed links utilize equalization to mitigate channel loss and dispersion. In addition, T-coil networks are used at inputs and outputs to improve impedance matching and to enhance the receiver and transmitter bandwidth. To guarantee the transceiver performance, a wide range of Serializer Deserializer (SerDes) compliance specifications exist for the return loss measured at or near the package interface and the Printed Circuit Board (PCB). For multi-protocol SerDes, thus, T-coil networks are often necessary to meet the most stringent return loss specification. This paper presents the analysis and characterization of a high-speed transceiver with T-coils designed in a 28 nm CMOS process. Measurements are also presented to demonstrate the improvement in return loss and bandwidth of the transceiver.
Sponsorship	IEEE Microwave Theory Tech. Soc.
Starting Page	203
Ending Page	206
File Size	922209
Page Count	4
File Format	PDF
ISBN	9781509000388
e-ISBN	9781509000401
DOI	10.1109/EPEPS.2015.7347162
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2015-10-25
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Loss measurement Receivers Transmitters Propagation losses Transceivers Fixtures Transmission line measurements T-coil High-speed transceiver Multi-protocol SerDes Return loss
Content Type	Text
Resource Type	Article

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