NDLI: GMR heads as ESD detectors - a direct assessment of subtle ESD

Content Provider	IEEE Xplore Digital Library
Author	Luo, J.S. Chin-Yu Yeh Sanayei, A.
Copyright Year	2001
Description	Author affiliation: Storage Syst. Div., IBM, San Jose, CA, USA (Luo, J.S.; Chin-Yu Yeh; Sanayei, A.)
Abstract	In this work, we demonstrate the importance and the effectiveness of using GMR heads as ESD detectors in new tester qualifications. Traditionally, to resolve ESD concerns of a new tester, a high bandwidth digital oscilloscope and a CT1 probe are often used for ESD waveform detection. An assessment is then provided based on the observed waveform. The methodology is largely consistent with investigations in a majority of papers published recently - a giant magnetoresistive (GMR) sensor is typically seen with catastrophic failure from SEM measurements if a sizable waveform is detected. As the scale of the GMR sensors reduces with each new product, it becomes essential to locate subtle ESD transient from the tester. This kind of transient will not cause any observable damage in SEM measurements and introduces nearly no resistance change. The transient, however, degrades magnetic performance of the sensor. The focus of the work is on transients that are more difficult to measure using an oscilloscope, and their impacts to the sensors are difficult to assess without direct measurements on the sensors.
Sponsorship	ESD Assoc. cooper. IEEE
Starting Page	316
Ending Page	319
File Size	2157058
Page Count	4
File Format	PDF
ISBN	9781585370399
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2001-09-11
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	EOS/ESD Association, Inc.
Subject Keyword	Electrostatic discharge Detectors Giant magnetoresistance Magnetic sensors Electrical resistance measurement Testing Magnetic heads Oscilloscopes Qualifications Bandwidth
Content Type	Text
Resource Type	Article

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