NDLI: Measurement of the effects of ionizer imbalance and proximity to ground in MR head handling

Content Provider	IEEE Xplore Digital Library
Author	Levit, L. Wallash, A.
Copyright Year	1998
Description	Author affiliation: Ion Syst., Berkeley, CA, USA (Levit, L.)
Abstract	Ionizers are employed to neutralize the static charge on parts used in disk drive manufacturing. Corona ionizers reduce static charges, lowering the voltages on sensitive components such as MR heads to a small but nonzero voltage. ANSI EOS/ESD S3.1-1991 attempts to characterize this voltage by defining the offset voltage measured with a charged plate monitor. Unfortunately, the voltage on the MR head can be either higher or lower than the offset voltage, depending upon its location and the proximity of grounded objects. In this presentation, the relationship between the location of the part, the offset voltage and the damage threshold are measured and discussed. For objects located more than 15 cm (6") above the work surface, the accepted 10 V damage threshold may underestimate the hazard. When the object is located a few mm (/spl sim/1/8-1/4") from the work surface, considerably more than 10 V of offset voltage is required to damage an MR head.
Starting Page	375
Ending Page	382
File Size	553183
Page Count	8
File Format	PDF
ISBN	1878303910
DOI	10.1109/EOSESD.1998.737059
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1998-10-06
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	EOS/ESD Association, Inc.
Subject Keyword	Disk drives Manufacturing Corona Earth Observing System Electrostatic discharge Current measurement Voltage measurement Monitoring Threshold voltage Hazards
Content Type	Text
Resource Type	Article

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