NDLI: Electron impact ionization and dielectric breakdown in liquid Xe and Ar

Content Provider	IEEE Xplore Digital Library
Author	Jones, H.M. Kunhardt, E.E.
Copyright Year	1994
Description	Author affiliation: Weber Res. Inst., Polytechnic Univ., Farmingdale, NY, USA (Jones, H.M.; Kunhardt, E.E.)
Abstract	Resolving the question of whether electron avalanches can occur in liquids is of fundamental importance when formulating models for electrical breakdown in liquids. It is of interest to study this phenomena in liq. Xe because: (a) there are practical applications involving high field electron transport in liq. Xe, (b) electron transport can be easily modeled in a simple liquid such as Xe, and (c) electron avalanches have been experimentally observed in liq. Xe, and so comparisons can be made. The electron energy distribution function, drift velocity, and ionization rate for electrons in liq. Xe have been calculated using a kinetic model for electron transport. The electron scattering rates have been obtained using the Van Hove approach in which the liquid is characterized by the dynamic structure function, S(q/spl I.oarr/,/spl omega/). The threshold field for ionization, E/sub t/ (such that the ionization coefficient, /spl alpha//spl ne/0 for E>E/sub t/) is found to be /spl ap/400 kV/cm. This value for E/sub t/ as well as those for /spl alpha/ are in good agreement with experiment. In particular the minimum at high fields in the experimental /spl alpha/ vs E curve is also present in the calculated results. These results serve to elucidate the kinetics of electron avalanches in liquids, and are used (with the results of Ref. [1]) to assess the "electronic" model of breakdown in liq. Xe and Ar.<>
Starting Page	438
Ending Page	441
File Size	367648
Page Count	4
File Format	PDF
ISBN	0780319427
ISSN	1089084X
DOI	10.1109/ELINSL.1994.401425
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1994-06-05
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Impact ionization Dielectric breakdown Dielectric liquids Scattering Electric breakdown Electron mobility Kinetic theory Distribution functions Argon Xenon
Content Type	Text
Resource Type	Article

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