NDLI: Dielectric strength of magnetic wire coatings exposed to simultaneous thermal and radiation aging

Content Provider	IEEE Xplore Digital Library
Author	Divljakovic, V. Van Vooren, E. Vekic, B. Vojnovic, B.
Copyright Year	1992
Description	Author affiliation: Eltek Int. Corp., St. Peters, MO, USA (Divljakovic, V.; Van Vooren, E.)
Abstract	The Arrhenius equation is used as a basis for accelerated determination of electrical insulation life. The usefulness of exposing insulation to simultaneous thermal and radiation aging in order to further accelerate aging mechanisms has been evaluated. Five different enamel wire coatings falling into five different temperature classes, were selected as test specimens (MW 28, MW 30, MW 74, MW 35, and MW 16). The test specimens were divided into three groups. The first group was used to establish initial values of dielectric strengths of the specimens. The second group was exposed only to high temperature. The third group was exposed to both high temperature and radiation from a cobalt 60 source. The results obtained show that the combination of high temperature and radiation can help determine the thermal class quicker than thermal exposure alone.<>
Starting Page	793
Ending Page	798
File Size	198235
Page Count	6
File Format	PDF
ISBN	0780305655
DOI	10.1109/CEIDP.1992.283199
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1992-10-18
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Dielectric breakdown Wire Coatings Temperature Aging Testing Equations Acceleration Insulation life Dielectrics and electrical insulation
Content Type	Text
Resource Type	Article

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