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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Narayandass, S.K. Kannan, M.D. Balasubramanian, C. Mangalaraj, D. |
| Copyright Year | 1992 |
| Description | Author affiliation: Dept. of Phys., Bharathiar Univ., Coimbatore, India (Narayandass, S.K.; Kannan, M.D.; Balasubramanian, C.; Mangalaraj, D.) |
| Abstract | The authors have systematically investigated the dielectric and breakdown characteristics of vacuum-deposited Nd/sub 2/O/sub 3/ and NdF/sub 3/ thin films over a wide range of frequency and temperature. From the loss characteristics the relaxation effect observed in NdF/sub 3/ films is attributed to a dielectric relaxation phenomenon arising from the dipolar orientation. The relaxation times for the two types of dipole relaxation, at 423 K, are 3.987*10/sup -8/ s and 7.24*10/sup -6/ s, respectively. The dipole moment, dipole strength, and dipole concentration have been estimated as 1.071*10/sup -27/ cm, 2.34*10/sup 4/, and 3.01*10/sup 27/ m/sup -3/, respectively. The dependence of thickness and temperature on the breakdown field follows the Forlani-Minnja electron avalanche theory.< |
| Starting Page | 555 |
| Ending Page | 560 |
| File Size | 240048 |
| Page Count | 6 |
| File Format | |
| ISBN | 0780305655 |
| DOI | 10.1109/CEIDP.1992.283157 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 1992-10-18 |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Dielectric breakdown Neodymium Dielectric thin films Vacuum breakdown Dielectric losses Vacuum systems Frequency Temperature distribution Temperature dependence Avalanche breakdown |
| Content Type | Text |
| Resource Type | Article |
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