NDLI: Electron beam induced luminescence of SiO2 optical coatings

Content Provider	IEEE Xplore Digital Library
Author	Dennison, J.R. Evans, A. Wilson, G. Dekany, J. Bowers, C.W. Meloy, R.
Copyright Year	2012
Description	Author affiliation: Materials Physics Group, Utah State University 4415 Old Main Hill, Logan, UT 84322 USA (Dennison, J.R.; Evans, A.; Wilson, G.; Dekany, J.) \|\| MEI Technologies, Inc., NASA Goddard Space Flight Center (Meloy, R.) \|\| NASA Goddard Space Flight Center Code 667, Greenbelt, MD 20771 USA (Bowers, C.W.)
Abstract	Optical coatings of disordered thin film SiO2/SiOx dielectric samples on reflective metal substrates exhibited cathodoluminescence under electron beam irradiation. Measurements of the absolute radiance and emission spectra as functions of incident electron energy, flux and power over a range of sample temperatures are reported. Radiance reached a saturation plateau at high incident electron power. Well below saturation radiance scaled with deposited power, that is linearly with incident power for lower-energy non-penetrating electrons and decreasing with increasing energy for penetrating radiation. Four bands were observed in spectral measurements from 300 nm to 1000 nm. Changes in peak intensity and shifts in peak energies as functions of temperature are described. The observations are explained in terms of a simple disordered band theory model and the transitions that take place between electrons in extended conduction states and localized trapped states associated with structural or compositional defects in the highly disordered insulating materials; this provides a fundamental basis for understanding the dependence of cathodoluminescence on irradiation time, incident flux and energy, and sample thickness and temperature.
Starting Page	479
Ending Page	482
File Size	644561
Page Count	4
File Format	PDF
ISBN	9781467312530
ISSN	00849162
e-ISBN	9781467312523
e-ISBN	9781467312516
DOI	10.1109/CEIDP.2012.6378824
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2012-10-14
Publisher Place	Canada
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Temperature measurement Luminescence Plasma temperature Electron beams Optical films Silicon compounds Optical reflection
Content Type	Text
Resource Type	Article

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