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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Zarbout, K. Ahmed, A.S. Moya, G. Damamme, G. Bernardini, J. Kallel, A. |
| Copyright Year | 2009 |
| Description | Author affiliation: Laboratoire des Matériaux Céramiques, Composites et Polymères, Faculté des Sciences de Sfax, BP. 1171, 3000 Sfax (Tunisie) (Kallel, A.) || CEA Ile-de-France, BP.12, 91680 Bruyères-le-Chatel (France) (Damamme, G.) || Institut Matériaux Microélectronique Nanosciences de Provence, UMR/CNRS 6242, Université Paul Cézanne, 13397 Marseille Cedex 20 (France) (Zarbout, K.; Ahmed, A.S.; Moya, G.; Bernardini, J.) |
| Abstract | This work shows that the recovery parameter Rs, used to investigate charge stability in polycrystalline alumina ceramics, can be connected with conduction mechanisms. This is achieved through a phenomenological model describing the SEE yield decay during electron irradiation. The insight provided by the new framework is utilized to identify the conduction mechanism involved in polycrystalline alumina containing only 150 ppm of various impurities. The enhancement of the parameter Rs with the temperature leads to an activation energy Ea of about 0.14 eV for grain diameters varying over the range 1.7–4.5 μm. This activation energy is attributed to hopping mechanism via localized states associated to impurities that have segregated at grain boundaries during the sintering process. |
| Starting Page | 173 |
| Ending Page | 176 |
| File Size | 336747 |
| Page Count | 4 |
| File Format | |
| ISBN | 9781424445578 |
| ISSN | 00849162 |
| DOI | 10.1109/CEIDP.2009.5377731 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2009-10-18 |
| Publisher Place | USA |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Surface charging Electron emission Ceramics Scanning electron microscopy Displacement measurement Current measurement Detectors Impurities Optical materials Dielectrics and electrical insulation |
| Content Type | Text |
| Resource Type | Article |
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