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Content Provider | IEEE Xplore Digital Library |
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Author | Laihonen, S.J. Gafvert, U. Schutte, T. Gedde, U.W. |
Copyright Year | 2004 |
Description | Author affiliation: ABB Corp. Res., Vasteras, Sweden (Laihonen, S.J.; Gafvert, U.) |
Abstract | DC breakdown voltages of 8-20 /spl mu/m thick poly(ethylene terephthalate) (PET) films were measured as a function of electrode area. The area of the measurement electrodes were between 0.045-9.3 cm/sup 2/. Also 13-15 m/sup 2/ capacitor elements were tested. Weibull distribution parameters, scale parameter /spl alpha/ and shape parameter /spl beta/, were fitted to the obtained breakdown strength data. Based on the small area results, short term breakdown strength of large area capacitor elements was predicted. Area extrapolation based on the scale parameter /spl alpha/ was compared with Weibull extrapolation, in which also the shape of the distribution is taken into account. It was concluded that the Weibull extrapolation better represented the large area breakdown strength than the area extrapolation. |
Starting Page | 563 |
Ending Page | 567 |
File Size | 304264 |
Page Count | 5 |
File Format | |
ISBN | 0780385845 |
DOI | 10.1109/CEIDP.2004.1364312 |
Language | English |
Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Publisher Date | 2004-10-20 |
Publisher Place | USA |
Access Restriction | Subscribed |
Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Subject Keyword | Electrodes Dielectric breakdown Dielectric thin films Power capacitors Extrapolation Electric breakdown Area measurement Dielectric measurements Shape Positron emission tomography |
Content Type | Text |
Resource Type | Article |
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