NDLI: Comparison between scanning acoustic microscopy and submillimeter spectroscopy. A new opportunity to investigate dielectric behavior and structure of materials

Content Provider	IEEE Xplore Digital Library
Author	Maev, R.G. Levin, V.M. Maeva, E.Yu. Volkov, A.A. Kozlov, G.V. Goncharov, Yu.G. Gorshunov, B.P.
Copyright Year	1996
Description	Author affiliation: Center of Acoust. Microscopy, Acad. of Sci., Moscow, Russia (Maev, R.G.)
Abstract	In acoustic microscopy, ultrasound and hypersound range waves (10 MHz-2 GHz) are used as the analysis factor. The following trends in the development of this method for polymers seem promising: morphology of smooth surfaces with nonuniform distribution of physical and mechanical properties, measurements of local anisotropy, study of dynamic phenomena connected with the change in materials due to physical factors (temperature, UV, IR, SHF-radiation), mechanical and chemical factors. In the field of submillimeter spectroscopy we have developed a spectrometer capable of performing dielectric measurements in solids in the previously inaccessible region of millimeter-submillimeter wavelengths (3-0.3 mm). The spectrometer employs intensive frequency tunable radiation from a Backward-Wave Oscillator (BWO) in combination with optical contactless measuring schemes, which realizes the most efficient advantages of infrared spectroscopy and conventional microwave technique: precise, independent measurements of the real /spl epsi/' and imaginary /spl epsi/'' parts of the spectra in a wide frequency range.
Starting Page	554
Ending Page	556
File Size	302269
Page Count	3
File Format	PDF
ISBN	0780335805
DOI	10.1109/CEIDP.1996.564532
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1996-10-23
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Microscopy Dielectric measurements Electrochemical impedance spectroscopy Microwave measurements Frequency measurement Wavelength measurement Acoustic waves Ultrasonic imaging Polymers Morphology
Content Type	Text
Resource Type	Article

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