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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Ping Yan Yuanxiang Zhou Guangsheng Sun Yoshimura, N. |
| Copyright Year | 2001 |
| Description | Author affiliation: Inst. of Electr. Eng., Acad. Sinica, Beijing, China (Ping Yan) |
| Abstract | Electrical trees are greatly influenced by the morphological structure in semi-crystalline polymers. In this paper, samples of polyethylene (PE) films have been annealed. The electrical tree initiation voltages of these samples also have been measured. It was found that the thickness of lamellae is the important parameter that affects the tree initiation. It was also found that the thermal stability could be related to the thickness of lamellae. It was considered that the larger the thickness of lamellae, the higher the thermal stability, which results in the more difficult tree initiation. |
| Sponsorship | IEEJ Tech. Committee on Dielectrics and Electr. Insulation Soc. |
| Starting Page | 631 |
| Ending Page | 634 |
| File Size | 472690 |
| Page Count | 4 |
| File Format | |
| ISBN | 4886860532 |
| DOI | 10.1109/ISEIM.2001.973750 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2001-11-22 |
| Publisher Place | Japan |
| Access Restriction | Subscribed |
| Rights Holder | The Institute of Electrical Engineers of Japan |
| Subject Keyword | Polyethylene Crystallization Polymers Thermal stability Temperature Annealing Voltage Surface morphology Optical films Optical microscopy |
| Content Type | Text |
| Resource Type | Article |
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