NDLI: Storage and decay of electrical charge in high temperature dielectrics

Content Provider	IEEE Xplore Digital Library
Author	Raju, G.R.G. Sussi, M.A.
Copyright Year	1991
Description	Author affiliation: Dept. of Electr. Eng., Windsor Univ., Ont., Canada (Raju, G.R.G.; Sussi, M.A.)
Abstract	The results of research into charge storage and its decay are reported for aromatic polyamides which are high-temperature dielectrics. Both thermal poling and corona charging techniques are used. Thermal poling is also carried out at various electric fields and TSD (thermally stimulated discharge) currents are measured by varying several parameters, such as the heating rate, material thickness, and storage temperature. The activation energy for the release of charges is determined by the plots of current and reciprocal of the temperature. The TSD current shows a peak at 135 degrees for a rate of heating of 1 K/min and shifts to a higher value. The charge released to the external circuit is proportional to the poling field. The relaxation time for the delay of charges has been measured by a new experimental procedure, and it is concluded that the material shows dipolar relaxation at 135 degrees C. A positive corona discharge in a point plane gap in air at atmospheric pressure is used for corona poling.<>
Starting Page	225
Ending Page	229
File Size	397987
Page Count	5
File Format	PDF
ISBN	0780300181
DOI	10.1109/EEIC.1991.162611
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1991-10-07
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Temperature Corona Current measurement Material storage Dielectric measurements Electric variables measurement Thickness measurement Resistance heating Dielectric materials Circuits
Content Type	Text
Resource Type	Article

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