NDLI: Stress relaxation of aluminum wire conductors

Content Provider	IEEE Xplore Digital Library
Author	Braunovic, M.
Copyright Year	1998
Description	Author affiliation: MB Interface, Montreal, Que., Canada (Braunovic, M.)
Abstract	Published experimental evidence and various reports of trouble in service suggest that the contact stability of aluminum wire connections is sometimes inadequate. Among a number of factors affecting the contact stability is a rather rapid stress relaxation of aluminum which can significantly reduce the contact stability. Stress relaxation behaviour of EC-1350 H12 and NUAL-H12 grade wire conductors was evaluated at 100/spl deg/C and under current-cycling conditions. In addition, the contact resistance behavior of these wire conductors in a binding-head screw under the influence of electrical current was also investigated. It was shown that the stress relaxation of EC-1350 grade aluminum wire and its contact resistance behaviour in a binding-head screw configuration is inferior to that of the NUAL wire conductor. Current-cycling carried out at room temperature at was found to produce as much stress relaxation as that carried out at 100/spl deg/C and much higher initial contact loads.
Starting Page	239
Ending Page	251
File Size	1103653
Page Count	13
File Format	PDF
ISBN	0780349253
DOI	10.1109/HOLM.1998.722452
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1998-10-26
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Aluminum Wire Conductors Creep Stability Temperature Connectors Residual stresses Contact resistance Current
Content Type	Text
Resource Type	Article

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