NDLI: Recognition and semi-differential invariants

Content Provider	IEEE Xplore Digital Library
Author	Van Gool, L. Kempenaers, P. Oosterlinck, A.
Copyright Year	1991
Description	Author affiliation: Katholieke Univ., Leuven, Belgium (Van Gool, L.; Kempenaers, P.; Oosterlinck, A.)
Abstract	Semidifferential invariants, combining coordinates in different points together with their derivatives, are used for the description of planar contours. Their use can be seen as a tradeoff between two extreme strategies currently used in shape recognition: (invariant) feature extraction methods, involving high-order derivatives, and invariant coordinate descriptions, leading to the correspondence problem of reference points. The method for the derivation of such invariants, based on Lie group theory and applicable to a wide spectrum of transformation groups, is described. As an example, invariant curve parameterizations are developed for affine and projective transformations. The usefulness of the approach is illustrated with two examples: (1) recognition of a test set of 12 planar objects viewed under conditions allowing affine approximations, and (2) the detection of symmetry in perspective projections of curves.<>
Starting Page	454
Ending Page	460
File Size	555570
Page Count	7
File Format	PDF
ISBN	0818621486
ISSN	10636919
DOI	10.1109/CVPR.1991.139735
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1991-06-03
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Shape Feature extraction Coordinate measuring machines Testing Object detection Object recognition Robustness Differential equations
Content Type	Text
Resource Type	Article
Subject	Computer Vision and Pattern Recognition Software

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