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Content Provider | IEEE Xplore Digital Library |
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Author | Vaisburd, D. Tverdokhlebov, S. Tukhfatulin, T. |
Copyright Year | 1996 |
Description | Author affiliation: Inst. of High-Current Electron., Acad. of Sci., Tomsk, Russia (Vaisburd, D.) |
Abstract | Since 1975, the authors' laboratory has been investigating the critical electron emission from dielectrics into vacuum with nanosecond time resolution using high-current-density electron accelerators. It allowed them to clear up some intrinsic properties of the critical electron emission induced by electron beam injection: (1) the emission pulse is delayed for several nanoseconds from the injection pulse; (2) the peak value of the emission current reaches 100-1000 A; (3) direct experimental evidence is obtained for intense electron-hole generation by superhigh electric field in subsurface layer of dielectric-this process is discovered to be the main reason of the transition to critical electron emission; (4) critical emission is not uniform and accompanied by point explosions on the dielectric surface and by injections of ion plasmas from these points into vacuum; and (5) transition of critical emission to vacuum breakdown has been observed. |
Starting Page | 435 |
Ending Page | 438 |
File Size | 344746 |
Page Count | 4 |
File Format | |
ISBN | 0780329066 |
DOI | 10.1109/DEIV.1996.545397 |
Language | English |
Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Publisher Date | 1996-07-21 |
Publisher Place | USA |
Access Restriction | Subscribed |
Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Subject Keyword | Electron emission Dielectrics Vacuum breakdown Electron accelerators Plasma properties Electron beams Delay DC generators Pulse generation Explosions |
Content Type | Text |
Resource Type | Article |
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