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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Puri, R. Stok, L. Bhattacharya, S. |
| Copyright Year | 2005 |
| Description | Author affiliation: IBM T. J. Watson Res. Center, Yorktown Hts, NY, USA (Puri, R.) |
| Abstract | With 90nm CMOS in production and 65nm testing in progress, power has been pushed to the forefront of design metrics. This paper outline practical techniques that are used to reduce both leakage as well as active power in a standard-cell library based high-performance design flow. We discuss the design and cost issues for using different power saving techniques such as: power gating to reduce leakage, multiple and hybrid threshold libraries for leakage reduction and multiple supply voltage based design. In addition techniques to reduce clock tree power are presented as power consumed in clocks accounts for a significant portion of total chip power. Practical aspects of implementing these techniques is also discussed. |
| Sponsorship | acm Special Interest Group on design automation (SIGda) EDA Consortium IEEE CASS/CANDE IEEE Circuits & Syst. Soc |
| Starting Page | 285 |
| Ending Page | 288 |
| File Size | 720366 |
| Page Count | 4 |
| File Format | |
| ISBN | 1595930582 |
| DOI | 10.1109/DAC.2005.193818 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2005-06-13 |
| Publisher Place | USA |
| Access Restriction | Subscribed |
| Rights Holder | Association for Computing Machinery, Inc. (ACM) |
| Subject Keyword | Clocks Power dissipation Libraries Threshold voltage Runtime Voltage control Frequency CMOS technology Gate leakage Energy consumption |
| Content Type | Text |
| Resource Type | Article |
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