NDLI: Understanding soft error propagation using Efficient vulnerability-driven fault injection

Content Provider	IEEE Xplore Digital Library
Author	Xin Xu Man-Lap Li
Copyright Year	2012
Description	Author affiliation: Department of Electrical and Computer Engineering, School of Engineering and Applied Science, George Washington University, DC 20052, USA (Xin Xu; Man-Lap Li)
Abstract	Extreme CMOS scaling is expected to significantly impact the reliability of future microprocessors, prompting recent research effort on low-cost hardware-software cross-layer reliability solutions. To evaluate, statistical fault injection (SFI) is often used to estimate the error coverage of the underlying method. Unfortunately, because a significant number of errors injected by SFI are often derated, the evaluation becomes less rigorous and less efficient. This paper makes the observation that many derated errors can be gracefully avoided to allow the fault injection campaign to focus on likely non-derated faults that stress the method-under-test. We propose a biased injection framework called CriticalFault that employs vulnerability analysis to map out relevant faults for stress testing. With CriticalFault, our results show that the injection space is reduced by 29% and 59% of the biased injections cause either software aborts or silent data corruptions, both are improvements from SFI. Moreover, we characterize different propagation behaviors of these non-derated faults and discuss the implications of designing future cross-layer solutions. Overall, not only CriticalFault is highly effective in identifying relevant test cases for current systems, but reliability researchers and engineers can also conduct more in-depth and meaningful analysis in deveoping future reliability solutions using CriticalFault.
Starting Page	1
Ending Page	12
File Size	1342517
Page Count	12
File Format	PDF
ISBN	9781467316248
ISSN	15300889
e-ISBN	9781467316255
e-ISBN	9781467316231
DOI	10.1109/DSN.2012.6263923
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2012-06-25
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Facsimile Reliability engineering Hardware Computational modeling Switches Soft Error Fault Injection Fault Analysis Vulnerability Microarchitecture
Content Type	Text
Resource Type	Article

Sl.	Authority	Responsibilities	Communication Details
1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
5	Website/Portal (Helpdesk)	Queries regarding NDLI and its services	support@ndl.gov.in
6	Contents and Copyright Issues	Queries related to content curation and copyright issues	content@ndl.gov.in
7	National Digital Library of India Club (NDLI Club)	Queries related to NDLI Club formation, support, user awareness program, seminar/symposium, collaboration, social media, promotion, and outreach	clubsupport@ndl.gov.in
8	Digital Preservation Centre (DPC)	Assistance with digitizing and archiving copyright-free printed books	dpc@ndl.gov.in
9	IDR Setup or Support	Queries related to establishment and support of Institutional Digital Repository (IDR) and IDR workshops	idr@ndl.gov.in

CriticalFault: Amplifying Soft Error Effect Using Vulnerability-Driven Injection

Modeling and analyzing the effect of microarchitecture design parameters on microprocessor soft error vulnerability.

Differential Fault Injection on Microarchitectural Simulators

Efficient Soft Error Vulnerability Analysis Using Non-intrusive Fault Injection Techniques

Understanding the propagation of transient errors in HPC applications

Fault injection verification of ibm power6 soft error resilience.

An Efficient Approach for Soft Error Rate Estimation of Combinational Circuits

Eliminating microarchitectural dependency from architectural vulnerability (2009)

Reducing Soft-error Vulnerability of Caches using Data Compression

Understanding soft error propagation using Efficient vulnerability-driven fault injection

Similar Documents

CriticalFault: Amplifying Soft Error Effect Using Vulnerability-Driven Injection

Modeling and analyzing the effect of microarchitecture design parameters on microprocessor soft error vulnerability.

Differential Fault Injection on Microarchitectural Simulators

Efficient Soft Error Vulnerability Analysis Using Non-intrusive Fault Injection Techniques

Understanding the propagation of transient errors in HPC applications

Fault injection verification of ibm power6 soft error resilience.

An Efficient Approach for Soft Error Rate Estimation of Combinational Circuits

Eliminating microarchitectural dependency from architectural vulnerability (2009)

Reducing Soft-error Vulnerability of Caches using Data Compression

Understanding soft error propagation using Efficient vulnerability-driven fault injection