NDLI: A New Paradigm for Software Reliability Modeling

Content Provider	IEEE Xplore Digital Library
Author	Ishii, T. Dohi, T.
Copyright Year	2008
Description	Author affiliation: Dept. of Inf. Eng., Hiroshima Univ., Higashi-Hiroshima, Japan (Ishii, T.; Dohi, T.)
Abstract	Non-homogeneous gamma process (NHGP) models with typical reliability growth patterns are developed for software reliability assessment in order to overcome a weak point of the usual non-homogeneous Poisson process (NHPP) models. Though the analytical treatment of NHGPs as stochastic point processes is not so easy in general, they have an advantage to involve the NHPPs as well as a gamma renewal process as special cases, and are rather tractable on parameter estimation by means of the method of maximum likelihood. We perform the goodness-of fit test for several NHGP-based software reliability models (SRMs) and compare them with the existing NHPP-based ones. Throughout a numerical example with a real software fault data, it is shown that the NHGP-based SRMs can provide the better goodness-of-fit performances in earlier testing phases than the NHPP-based ones, but approach to them gradually as the testing time goes on. This implies that our new software reliability modeling framework with flexibility can describe better the software-fault detection phenomenon when the less information on software fault data is available.
Starting Page	224
Ending Page	231
File Size	269375
Page Count	8
File Format	PDF
ISBN	9780769534480
DOI	10.1109/PRDC.2008.24
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2008-12-15
Publisher Place	Taiwan
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Software reliability Software testing Stochastic processes Performance evaluation Software performance Maximum likelihood estimation Fault detection Reliability engineering Software measurement Parameter estimation maximum likelihood estimation software reliability non-homogeneous Poisson process non-homogeneous gamma process reliability growth
Content Type	Text
Resource Type	Article

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3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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