NDLI: A Framework to Evaluate the Trade-Off among AVF, Performance and Area of Soft Error Tolerant Microprocessors

Content Provider	IEEE Xplore Digital Library
Author	Rui Gong Kui Dai Zhiying Wang
Copyright Year	2008
Description	Author affiliation: Sch. of Comput., Nat. Univ. of Defense Technol., Changsha (Rui Gong; Kui Dai; Zhiying Wang)
Abstract	Because of the increasing susceptibility of the integrated circuits to soft errors, many techniques have been proposed in all the design levels to reduce the AVF (architecturally vulnerable factor) of microprocessors with extra performance and area overheads. These overheads have a negative impact on the reliability. Conventional reliability evaluation frameworks do not take both performance and area overheads into account. A new metric, mMWTF (modified mean work to failure), is proposed in this paper to capture the trade-off among AVF, performance and area. A quantitative approach to evaluate mMWTF is also presented, in which fault injection is used to estimate the AVF. To modify the conventional fault injection methods which inject only SEU (single event upset), a new method is proposed to injects both SEU and MBU (multi bits upset), the latter of which happens more frequently with the shrinking feature size. Because of the new metric and the new fault injection method, the framework presented in this paper is more accurate than conventional ones. As a case study, two control flow checking techniques are proposed and evaluated in this paper. The evaluation results demonstrate that the techniques with better balance among AVF, performance and area can better improve the reliability of microprocessors.
Starting Page	184
Ending Page	192
File Size	339722
Page Count	9
File Format	PDF
ISBN	9780769533650
ISSN	15505774
DOI	10.1109/DFT.2008.9
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2008-10-01
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Microprocessors Reliability Random access memory Error analysis Software Benchmark testing Computer architecture
Content Type	Text
Resource Type	Article

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