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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Chuang Cheng Chih-Tsun Huang Jing-Reng Huang Cheng-Wen Wu Chen-Jong Wey Ming-Chang Tsai |
| Copyright Year | 2000 |
| Description | Author affiliation: Dept. of Electr. Eng., Nat. Tsing Hua Univ., Hsinchu, Taiwan (Chuang Cheng) |
| Abstract | A built-in self-test (BIST) compiler for embedded memories, called BRAINS (Bist for RAm IN Seconds), is proposed. According to the memory specifications and test requirements entered by the user, BRAINS generates the synthesizable BIST code in Verilog as well as the corresponding BIST activation sequence and test-bench. The synthesis scripts for a commercial synthesis tool are also generated automatically. The architecture for the BIST circuits generated by BRAINS is an improved version of our previous design. The new design provides at-speed testing, diagnosis support, and programmable March test algorithms. The BIST compiler framework facilitates the generation of BIST circuits for various SRAM and DRAM architectures and configurations-BRAINS supports commonly used memory cores such as SRAM, EDO DRAM, SDRAM, etc. It is easy to use BRAINS for customized embedded memories. We have designed the system so that future extension to other types of memory can be done under the same framework. |
| Starting Page | 299 |
| Ending Page | 307 |
| File Size | 629506 |
| Page Count | 9 |
| File Format | |
| ISBN | 0769507190 |
| ISSN | 10636722 |
| DOI | 10.1109/DFTVS.2000.887170 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2000-10-27 |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Built-in self-test Random access memory Circuit synthesis Circuit testing Circuit faults Algorithm design and analysis Costs Automatic testing SDRAM System-on-a-chip |
| Content Type | Text |
| Resource Type | Article |
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