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| Content Provider | IEEE Xplore Digital Library | 
|---|---|
| Author | Bringhurst, S. Iskander, M.F. | 
| Copyright Year | 1995 | 
| Description | Author affiliation: Dept. of Electr. Eng., Utah Univ., Salt Lake City, UT, USA (Bringhurst, S.; Iskander, M.F.) | 
| Abstract | Open-ended coaxial probes have been used for broadband dielectric properties measurements for several years. However open-ended probes have been limited to measuring "thick" samples, (e.g., samples that are thick enough to contain the majority of the electromagnetic field that is penetrating the sample). This is known as the infinite sample criteria. In conjunction with our ongoing research activities in the area of microwave processing of materials, we have developed a metallized ceramic coaxial probe for broadband, high-temperature dielectric properties measurements. We have also developed a method of using the metallized ceramic probe in conjunction with finite-difference time-domain (FDTD) numerical methods to make dielectric properties measurements on thin samples. The method is described and results are given to show the validity of the measurement procedure. Results from 2.5 mm thick Zirconia and 5 mm Teflon samples are accurate, and the developed measurement procedure is therefore promising. Results from error analysis calculations are also presented to help guide the successful implementation of the measurement procedure. | 
| Starting Page | 1844 | 
| Ending Page | 1847 | 
| File Size | 252152 | 
| Page Count | 4 | 
| File Format | |
| ISBN | 0780327195 | 
| DOI | 10.1109/APS.1995.530945 | 
| Language | English | 
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) | 
| Publisher Date | 1995-06-18 | 
| Publisher Place | USA | 
| Access Restriction | Subscribed | 
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) | 
| Subject Keyword | Dielectric measurements Electromagnetic measurements Probes Coaxial components Thickness measurement Metallization Ceramics Finite difference methods Time domain analysis Electromagnetic fields | 
| Content Type | Text | 
| Resource Type | Article | 
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