NDLI: Testability analysis using a discrete event systems framework

Content Provider	IEEE Xplore Digital Library
Author	Bavishi, S. Chong, E.K.P.
Copyright Year	1995
Description	Author affiliation: Sch. of Electr. Eng., Purdue Univ., West Lafayette, IN, USA (Bavishi, S.; Chong, E.K.P.)
Abstract	For a complex natural or a man-made system, automated fault detection and diagnosis often presents a challenging task. We previously (1994) presented results on the testability of a system whose fault behavior is modeled by a nondeterministic automaton. We also discussed issues pertaining to testability including minimal testable observation and the finest testable partition of the fault space. In this paper, we show that the definition of testability has a natural equivalent interpretation in terms of "one-step" faults. Specifically, we show the equivalence of the given automaton model and a directed bipartite graph under the testability definition. The equivalent bipartite graph representation allows us to derive an efficient fault diagnosis algorithm, when the system is assumed to be testable.
Starting Page	2621
Ending Page	2625
File Size	502224
Page Count	5
File Format	PDF
ISBN	0780324455
DOI	10.1109/ACC.1995.532322
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1995-06-21
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	System testing Discrete event systems Fault diagnosis Circuit faults Bipartite graph Monitoring Automata Automatic testing Circuit testing Fault detection
Content Type	Text
Resource Type	Article

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