NDLI: Low cost fault tolerant techniques for nano/pico-satellite applications

Content Provider	IEEE Xplore Digital Library
Author	Botma, P.J. Barnard, A. Steyn, W.H.
Copyright Year	2013
Description	Author affiliation: Electr. & Electron. Eng., Electron. Syst. Lab., Stellenbosch, South Africa (Botma, P.J.; Barnard, A.; Steyn, W.H.)
Abstract	Space is a hazardous environment for electronic equipment due to various high energy particles, also referred to as radiation, which adversely affect electronic components. The most notable of these radiation effects are single event latchups and single event upsets. In large and expensive satellites the use of radiation hardened components and redundancy mitigates the effects of radiation on the satellite. These techniques are not feasible on small satellites, especially in the nano to pico range, due to their limited power, size and financial budgets. However, by using fault tolerant design techniques (watchdogs, anti-latchup circuitry, error correction code) and implementing a robust bootloader for in-flight reprogramming, it is possible to achieve an acceptable fault tolerance level for short duration missions within low earth orbit with minimal overhead on the design. These low cost mitigation techniques have been implemented on a CubeSat onboard computer, to be used in the upcoming ZACube2 mission. The evaluation and implementation of these techniques and their impact on the onboard computer in terms of power, size and cost are discussed in this paper.
Sponsorship	IEEE Mauritius Subsect.
Starting Page	1
Ending Page	5
File Size	1177292
Page Count	5
File Format	PDF
ISBN	9781467359405
ISSN	21530033
e-ISBN	9781467359436
DOI	10.1109/AFRCON.2013.6757859
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2013-09-09
Publisher Place	Mauritius
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Random access memory Fault tolerance Fault tolerant systems Satellites Single event upsets Radiation effects Robustness Single Event Effects Nanosatellite Embedded Robust Fault Tolerant
Content Type	Text
Resource Type	Article
Subject	Electrical and Electronic Engineering Computer Science Applications

Sl.	Authority	Responsibilities	Communication Details
1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
5	Website/Portal (Helpdesk)	Queries regarding NDLI and its services	support@ndl.gov.in
6	Contents and Copyright Issues	Queries related to content curation and copyright issues	content@ndl.gov.in
7	National Digital Library of India Club (NDLI Club)	Queries related to NDLI Club formation, support, user awareness program, seminar/symposium, collaboration, social media, promotion, and outreach	clubsupport@ndl.gov.in
8	Digital Preservation Centre (DPC)	Assistance with digitizing and archiving copyright-free printed books	dpc@ndl.gov.in
9	IDR Setup or Support	Queries related to establishment and support of Institutional Digital Repository (IDR) and IDR workshops	idr@ndl.gov.in

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